Method and Apparatus for Determining Data Signal Jitter Via Asynchronous Sampling

ABSTRACT

A method and apparatus for determining data signal jitter via asynchronous sampling provides a low cost and production-integrable mechanism for measuring data signal jitter. The data signal is edge-detected and sampled by a sampling clock of unrelated frequency the sampled values are collected in a histogram according to a folding of the samples around a timebase. The timebase is determined by sweeping to detect a minimum jitter for the folded data. The histogram for the correct estimated timebase period is representative of the probability density function of the location of data signal edges and the jitter characteristics are determined by the width and shape of the density function peaks. Frequency drift can be corrected by adjusting the timebase used to fold the data across the sample set.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is related to co-pending U.S. applications: Ser. No.11/279,651 entitled “METHOD AND APPARATUS FOR DETERMINING JITTER ANDPULSE WIDTH FROM CLOCK SIGNAL COMPARISONS” filed on Apr. 13, 2006, Ser.No. 11/______, Atty. Docket Number AUS920050913US1, entitled “METHOD OFGENERATING AN EYE DIAGRAM FOR INTEGRATED CIRCUIT TRANSMITTED SIGNALS”and Ser. No. 11/______, Atty. Docket Number AUS920060202US1, entitled“METHOD AND APPARATUS FOR CONSTRUCTING A SYNCHRONOUS SIGNAL DIAGRAM FROMASYNCHRONOUSLY SAMPLED DATA”, filed concurrently with this application,by the same Inventors and assigned to the same Assignee. Thespecifications of the above-referenced applications are incorporatedherein by reference.

This invention was made with Government support under NBCH3039004,DARPA. THE GOVERNMENT HAS CERTAIN RIGHTS IN THIS INVENTION.

BACKGROUND OF THE INVENTION

1. Technical Field

The present invention relates generally to digital interface circuits,and more particularly, to circuits and systems that evaluate datajitter.

2. Description of the Related Art

Data jitter determination is necessary to evaluate the performance ofhigh-speed interface components and interfaces, as well as othercircuits where jitter affect the bit error rate (BER). Determining datajitter is also desirable in many circuits that determine the quality ofa received or transmitted data signal that also adapt performance of aninterface in order to accommodate or reduce a level of data signaljitter.

In laboratory environments, high-accuracy laboratory instruments may beused to determine the jitter of a signal via very stable referenceclocks and long integration times. However, the challenge of probing avery high frequency data signal and/or high-impedance data signal issignificant, as the effects of the probe must be accounted for in themeasurements and probe characteristics can vary over time and the probecompensation model may not be accurate under actual measurementconditions. Further, significant circuit area can be consumed in theimpedance-matched and isolated output pads that permit such precisionmeasurements. Such equipment is expensive and it is typically unfeasibleto incorporate the equivalent of such instrumentation within productioncircuits.

On-chip measurements of data jitter are either performed using aninternal global clock or an external sample clock with an internal delayline. Use of the internal global clock is limited in that clock jitterand data jitter cannot be separated. When an external sample clock isused, the delay accuracy, and thus the accuracy of the jittermeasurement, is difficult to control. Since one inverter delay istypically the shortest delay available for fabricating an internal delayline, the resolution of the jitter measurement is then limited to oneinverter delay. When measuring the jitter level of low-jitter signals,the resolution of the delay line technique is insufficient for accurateresults. Further, if a large delay range is provided, the area and powerrequired can be quite large, since the delay is typically operating at avery high clock frequency.

It is therefore desirable to provide a method and apparatus fordetermining data signal jitter that is low cost, can be at leastpartially integrated in a production circuit with no probing error andcan quickly determine the jitter level of a data signal.

SUMMARY OF THE INVENTION

The above-stated objectives of providing a low-cost apparatus and methodfor determining data signal jitter level is provided in a method andapparatus.

The method analyzes raw data provided by the apparatus, and theperformance of the method may be distributed between a test circuit anda workstation computer or may be completely embedded in a testinstrument or production integrated circuit.

The method collects values corresponding to edge positions of a datasignal under measurement by sampling the output of an edge detector thatreceives the data signal under measurement using a sampling clock signalthat differs at least slightly in frequency from rational multiples ofthe data rate.

The sampled edge data is analyzed according to a guess of therelationship between the periods/frequencies of the sampling clock andthe data rate, and the guess is adjusted either over a range, or untilan indication that the guess is correct is obtained, such as a jitteranalysis indicating minimum.

The period obtained above is used to generate a timebase to fold thesampled edge data. The frequency or period of neither the sampling clocksignal or data signal needs to be known in order to further analyze theedge data, only the relationship between the two, as determined by themethod described above. However, if the frequency of the sampling clocksignal is known to a sufficient degree of accuracy, then the data rateof the data signal under measurement can be determined from thetimebase.

The values of the edge detector samples, which are an indication of theposition of edges in the data signal, are then analyzed in accordancewith the correct period, in order to generate a histogram of sampleddata signal values on subintervals of the data period. The values areplaced into histogram “bins” that correspond to each sub-interval(slice) of the overall data period. Once the histogram is generated,which corresponds to the probability density function of the data signalvalues over one period, the histogram yields a measure of the jitter.The width of the probability density function peaks indicates the peakjitter and the shape of the peaks reveals the characteristics of thejitter for both rising and falling edges.

Drift between the frequency of the sampling clock signal and the edgepositions of the data signal can be removed from the analysis results byusing a linear or other shift model to progress the guessed periodacross the sample set, and the exact frequency drift can be identifiedfrom the histogram having the minimum widths of peaks in the probabilitydensity function.

The sampling/edge-detection circuit can be included in a production dieand the data collected by a workstation computer via direct probing or aboundary-scan data interface. Alternatively, a processing circuit oralgorithm may be present or loaded into a production integrated circuitthat includes a processor or a dedicated digital circuit use to conductthe above-described analysis. The analysis method may be embodied in acomputer-program product containing stored program instructions forcarrying out the steps of the method.

The foregoing and other objectives, features, and advantages of theinvention will be apparent from the following, more particular,description of the preferred embodiment of the invention, as illustratedin the accompanying drawings.

BRIEF DESCRIPTION OF THE DRAWINGS

Details of the invention and the uses thereof will be understood by aperson of ordinary skill in the art, when reading the following detaileddescription of illustrative embodiment in conjunction with theaccompanying drawings. Further objectives and advantages presented bythe invention will be apparent in light of the following description anddrawings, wherein like reference numerals indicate like components, and:

FIG. 1 is a block diagram of a first electronic unit connected by aninterface to a second electronic interface in accordance with anembodiment of the invention.

FIG. 2 is a pictorial diagram of a manufacturing tester and workstationcomputer connected to a device under measurement implementing a methodin accordance with an embodiment of the present invention.

FIGS. 3A and 3B are schematics of differing edge detectors that may beemployed in second electronic interface 10B of FIG. 1 in accordance withembodiments of the invention.

FIG. 4 is a flowchart illustrating a method in accordance with anembodiment of the invention.

FIGS. 5A-5E are graphs depicting data processing operations andmeasurements in a method according to an embodiment of the presentinvention.

FIG. 6 is a timing diagram illustrating a method of determiningestimated clock periods in accordance with an embodiment of theinvention.

FIGS. 7A-7D are graphs depicting operations in correcting frequencydrift in a method according to an embodiment of the present invention.

DESCRIPTION OF ILLUSTRATIVE EMBODIMENT

The present invention concerns the measurement of jitter of datasignals, and in particular, the measurement of jitter in interface datasignals. In order to produce accurate results, the capture ofmeasurement data is generally performed by a sampling circuit within theinterface (or other data-receiving circuit) rather than a separate testprobe. However, the techniques of the present invention can be appliedto and within test equipment, as well.

Primarily, the present invention provides new methods for analyzing dataobtained by sampling a data signal under measurement with anasynchronous sampling clock. Rather than filtering the sampled data, asis done within a phase-lock loop (PLL) loop filter, the presentinvention resolves the sampled data to identify a relationship betweenthe measured locations of data signal edges relative to the samplingclock and then determines the jitter of the measured data signal fromthe distribution of samples after folding the sampled data according tothe identified clock to data signal relationship.

Therefore, the sampling clock used to sample the data signal undermeasurement and the edges of the data signal (and integer multiples ofits data rate) must differ in frequency at least slightly and asufficient number of samples must be collected so that jitter can bedistinguished from variation due to slight frequency differences.Neither the data rate of the data signal under measurement nor thesampling clock period/frequency need be known in order to evaluate thejitter of the data signal. However, if highly stable frequency sourcewith known frequency is employed for the sampling clock, then the datarate of the data signal may be computed from the results of theanalysis.

With reference now to the figures, and in particular with reference toFIG. 1, there is depicted a block diagram of electrical units 10A and10B connected by a wired interface or other channel 12 that includes oneor more Data signals. Interface circuits 13A, 13B may be located withina device such as a computer peripheral, a computer system, or withinintegrated circuits interconnected within a system or may be a wirelessdevice interface having a clock signal embedded in a received signal.Clock 9 provides for synchronous generation of data provided fromelectrical unit 10A. Functional circuits 14A, 14B do not generally formpart of the present invention, but perform the functions associated withthe normal operation of units 10A and 10B. Functional circuit 14B isincluded to illustrate that the techniques of the present invention canbe applied to a functional device rather than a laboratory model.However, in some instances, the circuits required to perform themeasurements of the present invention will already be present infunctional circuits 14B of a particular electrical unit 10B withoutmodification, and the use of such functional circuits to perform datacollection as input to a method according to an embodiment the presentinvention are contemplated herein.

The circuit required for data collection is illustrated separately as ameasurement circuit 11 and includes a data edge detector 5, a samplingclock 15 and a storage 16 for storing samples of edges of interface 12Data signal collected from the output of edge detector 5 at edges ofsampling clock 15. A processor 18 and memory 19 are optionally includedfor performing methods according to the present invention, or the rawdata from storage 16 may be clocked out by a test system via boundarylatches 17 or otherwise read from unit 10B via interface 13B, e.g., byelectrical unit 10A as Sample Data over interface 12. Also, if processor18 and memory 19 are included, and the sampled data is processedlocally, interface 13B and/or boundary latches 17 may be read toretrieve the results of the analysis performed by a method according tothe present invention.

Some degree of tuning of sampling clock 15 must generally be provided,or sampling clock 15 frequency must be chosen so that the frequency willnot land on an exact multiple of the data rate of the measured datasignal, thus generating a zero beat frequency that will yield only asignal dependent on the presence or absence of data signal edges in thefolded data and not revealing the jitter. Sampling clock 15 is thereforeshown coupled to boundary latches 17 in order to provide to least asingle bit adjustment that can change the clock frequency of samplingclock 15 if needed to avoid sampling too close to a multiple of the datarate of the data signal under measurement. Sampling clock 15 may also beoptionally provided from an external source such as a test system,especially if a measurement of the data rate of the measured data signalis also desired.

Referring now to FIG. 2, a wafer test system, in which methods accordingto an embodiment of the present invention are performed, is depicted. Awafer tester 20 includes a boundary scan unit 21 for providing stimulusto and reading data from a die 22A on a wafer under test 22, via a probehead 23 having electrical test connections 23A to die 22A. An optionalsampling clock 15A is included for optionally providing a stable andaccurate clock to the above-described sampling circuits within die 22A,to either improve the measurement results, or to provide additionalmeasurement of the data rate of the data signal under measurement.

A workstation computer 28, having a processor 26 coupled to a memory 27,for executing program instructions from memory 27, wherein the programinstructions include program instructions for executing one or moremethods in accordance with an embodiment of the present invention, iscoupled to wafer tester 20, whereby the sampled clock data (or analysisresults from processor 18 and memory 19 of FIG. 1) can be retrieved. ACD-ROM drive 25 is also coupled to processor 26 for transfer of programproducts from media such as CD-ROM CD that contain program instructionsfor executing methods in accordance with embodiments of the presentinvention.

Workstation computer 28 is also coupled to a graphical display 29 fordisplaying program output such as the jitter computed by embodiments ofthe present invention, as well as graphical data such as the graphsdepicted in FIGS. 5A-5E and 7A-7D as described below. Workstationcomputer 28 is further coupled to input devices such as a mouse 24B anda keyboard 24A for receiving user input. Workstation computer may becoupled to a public network such as the Internet, or may be a privatenetwork such as the various “intra-nets” and software containing programinstructions embodying methods in accordance with embodiments of thepresent invention may be located on remote computers or locally withinworkstation computer 28. Further, workstation computer 28 may be coupledto wafer tester 20 by such a network connection.

While the system of FIG. 2 depicts a configuration suitable forsequential test of a plurality of dies on a wafer, the depicted systemis illustrative and not limiting to the present invention. Probe head 23may be a multi-die full wafer probe system, or may comprise multipleprobe heads for simultaneously testing multiple wafers on a single ormultiple die basis. Additionally, while boundary scan data retrieval isillustrated, the techniques of the present invention may also be appliedto a data interface including the loading of program code to memory 19(FIG. 1) for execution by processor 18 (FIG. 1) incorporated on die 22Ato an interface other than boundary scan unit 21, for example, via adedicated test interface device that retrieves sampled clock data fromstorage 16 (FIG. 1) or test results from memory 19.

Referring now to FIG. 3A, a data edge detector circuit 5A as may beemployed in measurement circuit 11 of FIG. 1 is depicted. Data edgedetector 5A receives the Data Signal under measurement and the samplingclock signal. A first comparator K1 compares Data Signal to a referencebias voltage V_(B) to provide an output that changes when Data Signalchanges logical state. A second comparator K2 compares Data Signal to aslightly differing reference bias voltage V_(B)+d, causing the output ofcomparator K2 to change either slightly earlier or later than the outputof K1, depending on the direction of the transition in Data Signal. Alogical exclusive-OR gate XOR1 produces a logical high output only whenthe outputs of comparators K1 and K2 differ, thus providing an outputsignal that contains pulses in the near vicinity of the transitions ofData Signal.

Referring now to FIG. 3B, a data edge detector circuit 5B as may bealternatively employed in measurement circuit 11 of FIG. 1 is depicted.Data edge detector 5B receives the Data Signal under measurement and thesampling clock signal. A first latch D1 latches the value of the DataSignal at an edge of the Reference Clock signal and a second latch D2latches the value of the Data Signal at an edge of a delayed version ofthe Reference Clock signal as provided by delay 7. A logicalexclusive-OR gate XOR2 produces a logical high output only when theoutputs of latches D1 and D2 differ, thus providing an output signalthat contains pulses in the near vicinity of the transitions of DataSignal.

In contrast to the techniques disclosed in the above-incorporated U.S.patent application “METHOD AND APPARATUS FOR DETERMINING JITTER ANDPULSE WIDTH FROM CLOCK SIGNAL COMPARISONS”, for the techniques of thepresent invention, a much larger sample set is required. The sample setmust be larger so that a reasonable number of samples of the outputs ofedge detector 5A or 5B is captured. Since the edge detector output formsa very small portion of the overall data period, the number of samplesthat must be taken in order to collect a sufficient number of edges forjitter measurement will be very large. In order to conserve storagespace, edge location values such as those stored in storage 16 of FIG. 1may be stored with an encoding mechanism such as a run-length limited(RLL) or other compression technique that takes advantage of therelative sparse presence of detected edges in the data set.

Referring now to FIG. 4, a method according to an embodiment of thepresent invention is illustrated in a flowchart. The edges of the datasignal under measurement are sampled with an asynchronous local samplingclock (step 30) to obtain N samples. If the period of the data signalunder measurement is known, then T is set to that period, otherwise T isset to 1 (step 31). Next, an initial guess of the sampling clock periodTG is made as a number<=T/2N (step 32). A coherency check is made on therelationship between T and TG to reject clock period guesses that areclosely related (decision 33) and if the coherency check fails, TG isincremented (step 34). Next, a timebase is generated from TG and anoptional drift correction is applied and the samples are folded to aunit interval using the optionally drift-corrected timebase (step 35).The samples are then binned into histogram bins according to thesub-intervals indicated by the timebase (step 36) and the probabilitydensity function (pdf) computed by the count of logical “1” values ineach bin (step 37). The jitter determined from the pdf (step 38).

The above-described steps from decision 33 to step 38 are repeated forall increments of TG up to T/2 (decision 39). Also, until all desireddrift corrections are applied (decision 40), new drift corrections areapplied (step 41) and step 32 through decision 39 are repeated. Afterthe edge position data values have been analyzed over all timebaseperiods and drift corrections, the TG period for which the minimumjitter is present (step 42) is taken as the correct clock period andfurther jitter characteristics are determined from the shape of the pdf(step 43). The RMS value of the jitter can be determined from the shapeof the pdf peak, and further characteristics, such as sinusoidal jitterprofiles can be observed from the overall shape of the distribution.

At one particular TG value, the jitter value will drop dramatically,with a sharp peak in the pdf indicating that TG is at the correct valueper step 42. Even a small deviation in period from the actual period ofthe sampling clock will result in an essentially equal distribution ofvalues across the bins if a sufficient number of values are collected,and thus a high jitter value for the data signal under measurement.

Referring now to FIGS. 5A-5D, the graphs depicted illustrate the methoddescribed above with respect to FIG. 4. FIG. 5A shows the input datasignal when sampled at the correct TG, provided here for illustrativepurposes. The nominal crossing of the large bands seen in the data setcorresponds to the location of the nominal data rate with respect to thesampling clock period.

FIG. 5B shows the distribution of accumulated sample values(corresponding 1V and 0V) after folding with the correct estimatedperiod. The overlapping regions correspond to the range of time acrosswhich data signal transitions are spread due to the jitter. The periodin the graphs is expressed as the modulo remainder of TG/T, whichprovides a unit interval of reference for the folded data.

FIG. 5C shows a graph of estimated jitter vs. sampling clock period. Thesharp drop in jitter at approximate period ?t=0.2 indicates the correctsampling clock period. FIG. 5D shows the distribution of edge values inthe histogram after finding the correct period.

Referring now to FIG. 5E a graph of jitter versus sampling clock periodis shown across the unit interval from a zero modulus period 52corresponding to a zero difference in periods between the data signalunder measurement and the sampling clock, to a period 53 that indicatesa difference in clock periods corresponding to one clock being twice thefrequency of the other. (The 1.0 and 0 values are essentially the samepoint on the unit interval since mod [2T/T]=0.)

The very low jitter values at periods 52 and 53 are due to the DC valueyielded from the sample set being read at effective identical positionswithin the waveform of the clock under measurement, i.e. coherentsampling, which is rejected by the above-described method in step 33 ofFIG. 4. Periods 50 and 51 are the correct estimated periods, having theminimum amount of actual jitter and correspond to modulus of the ratiobetween the data signal data rate and the sampling clock periods. As canbe observed from the figure, the graph is symmetrical around T/2, so theestimated period only needs to be swept over half of the unit interval.The other drops in jitter value correspond to products of harmonicrelationships of higher order between the guessed period, the samplingclock and the data signal data rate.

Referring now to FIG. 6, a pictorial diagram illustrating the foldingtechnique is shown. The illustration is a simplified diagram thatillustrates a Sampling Clock signal providing an oversampling factor ofapproximately, but not exactly 10, where in actuality the data signalmay be oversampled or undersampled. The Data Signal is the actual datasignal under measurement and Data Signal Edges signal is the output ofedge detector 5 of FIG. 1. The waveforms beneath, though drawn ascontinuous waveforms, represent samples in the data set provided bysampling the Data Signal Edges signal with the Sampling Clock signal andselecting specific samples from the data set to “reconstruct” the edgesof the Data Signal Edges signal. In the Correct Estimated Period signal,the samples are chosen according to a period that corresponds to thecorrect relationship between the Data Signal period (data rate) and theSampling Clock signal period, and therefore only jitter and anydeviations in the edge detector pulse width or delay will causedifferences between the expected position of an edge and the actualposition of the edge in the data set (illustrated by the arrows). Forthe Incorrect estimated period signal illustrated, the progressive (andcyclic) edge differences will yield a “jitter” distribution that isuniform for large enough sample sets, as the distance between theexpected edge locations and the actual edge locations cycle through afull range of phase differences. Therefore, the minimum jitterdistribution will occur when the guessed period is equal to the correctsampling clock period.

FIGS. 7A-7D illustrate the application of a frequency drift correctionfunction in the methods of the present invention. FIG. 7A depicts anoptional drift correction function used to increase or decrease theguessed period progressively over the sample set during the methoddescribed above. FIG. 7B illustrates the distribution of the data signaledge samples without drift correction. FIG. 7C illustrates the spread ofthe data signal edges in time without drift correction and correspondsto FIG. 5B described above. FIG. 7D shows the spread of data signaledges after the proper drift correction has been applied.

The description provided above constitutes a description of thepreferred embodiments of the invention, but the invention is not limitedto the particular implementations shown or described. Those skilled inthe art, having seen the above description and accompanying drawings,will understand that changes in form, structure and other details, aswell as the order of operation of any operative steps may be variedwithout departing from the spirit and scope of the invention.

1. A method of measuring jitter of a data signal, comprising: detecting edges of said data signal to provide an indication of presence of said edges; collecting samples of values of said indication at regular intervals having a sampling period differing from a multiple of a data rate of said data signal; determining a timebase period corresponding to a relationship between said sampling period and said data rate; grouping said values according to said timebase period into bins of a histogram corresponding to sub-intervals of said data rate; and analyzing said histogram to determine a level of said jitter of said data signal.
 2. The method of claim 1, wherein said analyzing comprises: determining a width of a distribution of said values in said histogram in a region of transition of said data signal; and computing said jitter level from said width.
 3. The method of claim 1, wherein said determining said timebase period comprises: computing an indication of an amount of effective jitter of said data signal for said estimated period; and adjusting said timebase period until a timebase period yielding a minimum amount of said effective jitter is found.
 4. The method of claim 3, further comprising changing said timebase period across said samples during said grouping to correct for drift in at least one of a width of said regular intervals and said data rate.
 5. The method of claim 1, wherein said collecting is performed using a sampling clock having a known sampling period, and further comprising calculating said data rate of said data signal from said timebase period.
 6. The method of claim 1, wherein said detecting is performed by generating a pulse commencing when said data signal crosses a first transition voltage level and ending when said data signal crosses a second transition voltage level.
 7. The method of claim 1, wherein detecting is performed by generating a pulse commencing when a sampling clock samples a change in said data signal and ending after expiration of a predetermined delay.
 8. The method of claim 1, wherein said analyzing comprises: determining a standard deviation of a distribution of said values in said histogram in a region of transition of said data signal; and computing an RMS jitter level from said width.
 9. The method of claim 1, wherein said analyzing comprises: observing a shape of said histogram in a region of transition of said data signal; and determining a non-random characteristic of said jitter from said shape.
 10. A workstation computer system comprising a processor for executing program instructions coupled to a memory for storing program instructions and data, wherein said program instructions comprise program instructions for measuring jitter of a data signal under measurement, said program instructions comprising program instructions for: collecting samples of values of an indication of edge positions of said data signal at regular intervals having a sampling period differing from a multiple of a data rate of said data signal; determining a timebase period corresponding to a relationship between said sampling period and said data rate; grouping said values according to said timebase period into bins of a histogram corresponding to sub-intervals of said data rate; and analyzing said histogram to determine a level of said jitter of said data signal.
 11. The workstation computer system of claim 10, wherein said program instructions for analyzing comprise program instructions for: determining a width of a distribution of said values in said histogram in a region of transition of said data signal; and computing said jitter level from said width.
 12. The workstation computer system of claim 10, wherein said program instructions for determining said timebase period comprise program instructions for: computing an indication of an amount of effective jitter of said data signal for said estimated period; and adjusting said timebase period until a timebase period yielding a minimum amount of said effective jitter is found.
 13. The workstation computer system of claim 10, wherein said program instructions further comprise program instructions for changing said timebase period across said samples during said grouping to correct for drift in at least one of a width of said regular intervals and said data rate.
 14. The workstation computer system of claim 10, wherein said collection of samples were collected using a sampling clock having a known sampling period, and further comprising program instructions for calculating said data rate from said timebase period.
 15. A computer program product comprising signal-bearing media encoding program instructions for execution within a computer system, wherein said program instructions comprise program instructions for measuring jitter of a data signal under measurement, said program instructions comprising program instructions for: collecting samples of values of an indication of edge positions of said data signal at regular intervals having a sampling period differing from a multiple of a data rate of said data signal; determining a timebase period corresponding to a relationship between said sampling period and said data rate; grouping said values according to said timebase period into bins of a histogram corresponding to sub-intervals of said data rate; and analyzing said histogram to determine a level of said jitter of said data signal.
 16. The computer program product of claim 15, wherein said program instructions for analyzing comprise program instructions for: determining a width of a distribution of said values in said histogram in a region of transition of said data signal; and computing said jitter level from said width.
 17. The computer program product of claim 15, wherein said program instructions for determining said timebase period comprise program instructions for: computing an indication of an amount of effective jitter of said data signal for said estimated period; and adjusting said timebase period until a timebase period yielding a minimum amount of said effective jitter is found.
 18. The computer program product of claim 15, wherein said program instructions further comprise program instructions for changing said timebase period across said samples during said grouping to correct for drift in at least one of a width of said regular intervals and said data rate.
 19. The computer program product of claim 15, wherein said collection of samples were collected using a sampling clock having a known sampling period, and further comprising program instructions for calculating said data rate from said timebase period.
 20. The computer program product of claim 15, wherein said program instructions for analyzing comprise program instructions for: determining a standard deviation of a distribution of said values in said histogram in a region of transition of said data signal; and computing an RMS jitter level from said width.
 21. A circuit, comprising: an interface terminal for receiving a data signal; an edge detector for providing samples indicating edges of said data signal at transitions of a sampling clock asynchronous with said data signal; a storage for storing said samples; and a data analysis circuit for determining a timebase period corresponding to a relationship between said sampling period and said data rate, grouping said values according to said timebase period into bins of a histogram corresponding to sub-intervals of said data rate, and analyzing said histogram to determine a level of said jitter of said data signal.
 22. The circuit of claim 21, wherein said data analysis circuit further determines a width of a distribution of said values in said histogram in a region of transition of said data signal and computing said jitter level from said width.
 23. The circuit of claim 21, wherein said data analysis circuit computes said time base period by computing an indication of an amount of effective jitter of said data signal for said estimated period, and adjusting said timebase period until a timebase period yielding a minimum amount of said effective jitter is found. 